The Physics of Surface Science
AUSSL has several standard and specialty surface science techniques that address a
variety of surface and thin film phenomena. Three Kratos XSAM 800 surface analytical and
ion scattering (ISS) enables the study of interfaces with sub-monolayer sensitivity.
The dynamics of surface chemical reactions is probed by scanning kinetic spectroscopy
(SKS), thermal desorption techniques (TPD), and electron-stimulated desorption (ESD).
Rutherford backscattering spectroscopy (RBS) and light ion channeling enable
non-destructive and quantitative materials analysis of layered materials.
Characterization of transport properties and microstructures is carried out by optical
(Nomarski, stereo, and digital) microscopy and scanning electron microscopy (SEM),
transmission electron microscopy (STEM), atomic force microscopy (AFM), Hall effect
equipment, current-voltage (I-V), and capacitance-voltage (CV) measurements.
Photolithography and thin film deposition equipment enable the manufacture of circuit test
structures, ohmic, and Schottky barrier contacts.
A brief description of some of our standard techniques . . .